@misc{indiciae98742c1ef9ac,
  title = {Using engineered defects to understand the seed for instabilities in current-driven metal.},
  author = {Yu, Edmund and Awe, Thomas James and Hutchinson, Trevor M and Hatch, Maren Whiting and Yates, Kevin and Cochrane, Kyle and Bauer, Bruno Steven and Tomlinson, Kurt and Tatum, William and Peterson, Kyle John and Yager-Elorriaga, David Alexander and Hutsel, Brian Thomas and Harding, Eric and Klemmer, Aidan William and Gilmore, Mark Allen and Shipley, Gabriel A. and Kreher, Seth},
  year = {2020},
  url = {https://www.osti.gov/biblio/1812164},
  note = {Source identifier: 1812164}
}