TY  - RPRT
TI  - FPGA Reliability Test Design Using Parametric Degradation Analysis.
AU  - Ozment, Seth James
AU  - Leonhardt, Darin
AU  - Grzybowski, Thomas Anthony
AU  - Fellows, Matthew Ward
PY  - 2020
UR  - https://www.osti.gov/biblio/1812458
ID  - 1812458
ER  -