@misc{indiciae02b2ca33e75a,
  title = {Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization},
  author = {Allen, Frances I and Pekin, Thomas C and Persaud, Arun and Rozeveld, Steven J and Meyers, Gregory F and Ciston, Jim and Ophus, Colin and Minor, Andrew M},
  year = {2021},
  doi = {10.1017/s1431927621011946},
  url = {https://www.osti.gov/biblio/1819870},
  note = {Source identifier: 1819870}
}