TY  - RPRT
TI  - Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
AU  - Allen, Frances I
AU  - Pekin, Thomas C
AU  - Persaud, Arun
AU  - Rozeveld, Steven J
AU  - Meyers, Gregory F
AU  - Ciston, Jim
AU  - Ophus, Colin
AU  - Minor, Andrew M
PY  - 2021
DO  - 10.1017/s1431927621011946
UR  - https://www.osti.gov/biblio/1819870
ID  - 1819870
ER  -