@misc{indiciae92a4ca870403,
  title = {Machine learning detection and classification of defects in STM lithography data.},
  author = {Noble Hernandez, Daniel Alejandro and Ivie, Jeffrey Andrew and Kalinin, Sergei V and Ziatdinov, Maxim and Scrymgeour, David and Bussmann, Ezra and Mounce, Andrew},
  year = {2020},
  url = {https://www.osti.gov/biblio/1822623},
  note = {Source identifier: 1822623}
}