@misc{indiciae144eb4aad2e0,
  title = {Image charge interaction correction in charged-defect calculations},
  author = {Suo, Zhao-Jun and Luo, Jun-Wei and Li, Shu-Shen and Wang, Lin-Wang},
  year = {2020},
  doi = {10.1103/physrevb.102.174110},
  url = {https://www.osti.gov/biblio/1823406},
  note = {Source identifier: 1823406}
}