TY  - RPRT
TI  - Image charge interaction correction in charged-defect calculations
AU  - Suo, Zhao-Jun
AU  - Luo, Jun-Wei
AU  - Li, Shu-Shen
AU  - Wang, Lin-Wang
PY  - 2020
DO  - 10.1103/physrevb.102.174110
UR  - https://www.osti.gov/biblio/1823406
ID  - 1823406
ER  -