@misc{indiciae029fe6a9e34d,
  title = {High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy},
  author = {Rault, Julien E. and Kuo, Cheng-Tai and Martins, Henrique P. and Conti, Giuseppina and Nemšák, Slavomír},
  year = {2021},
  doi = {10.1116/6.0001289},
  url = {https://www.osti.gov/biblio/1826935},
  note = {Source identifier: 1826935}
}