TY  - RPRT
TI  - High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy
AU  - Rault, Julien E.
AU  - Kuo, Cheng-Tai
AU  - Martins, Henrique P.
AU  - Conti, Giuseppina
AU  - Nemšák, Slavomír
PY  - 2021
DO  - 10.1116/6.0001289
UR  - https://www.osti.gov/biblio/1826935
ID  - 1826935
ER  -