TY  - RPRT
TI  - Electronically induced defect creation at semiconductor/oxide interface revealed by time-dependent density functional theory
AU  - Liu, Yue-Yang
AU  - Wei, Zhongming
AU  - Meng, Sheng
AU  - Wang, Runsheng
AU  - Jiang, Xiangwei
AU  - Huang, Ru
AU  - Li, Shu-Shen
AU  - Wang, Lin-Wang
PY  - 2021
DO  - 10.1103/physrevb.104.115310
UR  - https://www.osti.gov/biblio/1829061
ID  - 1829061
ER  -