TY  - RPRT
TI  - Understanding the relationship between current loss and load hardware geometry in Z machine experiments.
AU  - Zimmer, Dana
AU  - Gomez, Matthew R
AU  - Jennings, Christopher Ashley
AU  - Myers, Clayton Edward
AU  - Conti, F.
AU  - Beg, F.
PY  - 2020
DO  - 10.2172/1831383
UR  - https://www.osti.gov/biblio/1831383
ID  - 1831383
ER  -