@misc{indiciae7caee7598c74,
  title = {Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques},
  author = {Gallagher, James C. and Ebrish, Mona A. and Porter, Matthew A. and Jacobs, Alan G. and Gunning, Brendan P. and Kaplar, Robert J. and Hobart, Karl D. and Anderson, Travis J.},
  year = {2022},
  doi = {10.1038/s41598-021-04170-2},
  url = {https://www.osti.gov/biblio/1839776},
  note = {Source identifier: 1839776}
}