TY  - RPRT
TI  - Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques
AU  - Gallagher, James C.
AU  - Ebrish, Mona A.
AU  - Porter, Matthew A.
AU  - Jacobs, Alan G.
AU  - Gunning, Brendan P.
AU  - Kaplar, Robert J.
AU  - Hobart, Karl D.
AU  - Anderson, Travis J.
PY  - 2022
DO  - 10.1038/s41598-021-04170-2
UR  - https://www.osti.gov/biblio/1839776
ID  - 1839776
ER  -