@misc{indiciaedcbf48fe8d2d,
  title = {Multi defect detection and analysis of electron microscopy images with deep learning},
  author = {Shen, Mingren and Li, Guanzhao and Wu, Dongxia and Liu, Yuhan and Greaves, Jacob R. C. and Hao, Wei and Krakauer, Nathaniel J. and Krudy, Leah and Perez, Jacob and Sreenivasan, Varun and Sanchez, Bryan and Torres-Velázquez, Oigimer and Li, Wei and Field, Kevin G. and Morgan, Dane},
  year = {2021},
  doi = {10.1016/j.commatsci.2021.110576},
  url = {https://www.osti.gov/biblio/1845761},
  note = {Source identifier: 1845761}
}