TY  - RPRT
TI  - Universal machine learning framework for defect predictions in zinc blende semiconductors
AU  - Mannodi-Kanakkithodi, Arun
AU  - Xiang, Xiaofeng
AU  - Jacoby, Laura
AU  - Biegaj, Robert
AU  - Dunham, Scott T.
AU  - Gamelin, Daniel R.
AU  - Chan, Maria K.Y.
PY  - 2022
DO  - 10.1016/j.patter.2022.100450
UR  - https://www.osti.gov/biblio/1846304
ID  - 1846304
ER  -