@misc{indiciae21b0c96befc9,
  title = {Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system},
  author = {Alipour, Afshin and Moheimani, S. O. Reza and Owen, James H. G. and Fuchs, Ehud and Randall, John N.},
  year = {2021},
  doi = {10.1116/6.0001107},
  url = {https://www.osti.gov/biblio/1848738},
  note = {Source identifier: 1848738}
}