@misc{indiciaeaa1abead523d,
  title = {A robust high sensitivity scanning thermal probe for simultaneous microscale thermal and thermoelectric property mapping},
  author = {Kempf, Nicholas and Zhang, Yanliang},
  year = {2021},
  doi = {10.1063/5.0058661},
  url = {https://www.osti.gov/biblio/1850533},
  note = {Source identifier: 1850533}
}