TY  - RPRT
TI  - Extraction of Data-Driven Compact Models from High-Fidelity Semiconductor Simulations with Topological Data Analysis.
AU  - Huang, Andy
AU  - Trask, Nathaniel Albert
AU  - Gao, Xujiao
AU  - Reza, Shahed
AU  - Wilcox, Ian Zachary
AU  - Diaz, Candace Pauline
PY  - 2021
DO  - 10.2172/1854316
UR  - https://www.osti.gov/biblio/1854316
ID  - 1854316
ER  -