@misc{indiciaea6f3debaa647,
  title = {On-Wafer Microfabricated Test Structures for Characterizing RF Breakdown in Narrow Gaps.},
  author = {Ruyack, Alexander and Jordan, Matthew and Moore, Christopher and Hummel, Gwendolyn and Herrera, Sergio A. and Ballance, Mark Harry and Bingham, Andrew Joel and Schiess, Adrian Rain Boese and Gibson, Christopher Baron and Nordquist, Christopher},
  year = {2021},
  doi = {10.1109/wmcs52222.2021.9493274},
  url = {https://www.osti.gov/biblio/1865769},
  note = {Source identifier: 1865769}
}