TY  - RPRT
TI  - Simulating Microstructure Evolution in Ni-YSZ Electrodes of Solid Oxide Cell Under Operating Conditions
AU  - Lei, Yinkai
AU  - Epting, William
AU  - Mason, Jerry H.
AU  - Cheng, Tianle
AU  - Abernathy, Harry
AU  - Hackett, Gregory
AU  - Wen, Youhai
PY  - 2022
DO  - 10.1007/978-3-030-92381-5_42
UR  - https://www.osti.gov/biblio/1867576
ID  - 1867576
ER  -