TY  - RPRT
TI  - On-Wafer Microfabricated Test Structures for Characterizing RF Breakdown in Narrow Gaps.
AU  - Ruyack, Alexander
AU  - Jordan, Matthew
AU  - Moore, Christopher
AU  - Hummel, Gwendolyn
AU  - Herrera, Sergio A.
AU  - Ballance, Mark Harry
AU  - Bingham, Andrew Joel
AU  - Schiess, Adrian Rain Boese
AU  - Gibson, Christopher Baron
AU  - Nordquist, Christopher
PY  - 2021
DO  - 10.2172/1869544
UR  - https://www.osti.gov/biblio/1869544
ID  - 1869544
ER  -