@misc{indiciae46d005c0c888,
  title = {Nondestructive microstructural investigation of defects in 4H-SiC epilayers using a multiscale luminescence analysis approach},
  author = {El Hageali, Sami A. and Guthrey, Harvey and Johnston, Steven and Soto, Jake and Odekirk, Bruce and Gorman, Brian P. and Al-Jassim, Mowafak},
  year = {2022},
  doi = {10.1063/5.0088313},
  url = {https://www.osti.gov/biblio/1871806},
  note = {Source identifier: 1871806}
}