TY  - RPRT
TI  - Nondestructive microstructural investigation of defects in 4H-SiC epilayers using a multiscale luminescence analysis approach
AU  - El Hageali, Sami A.
AU  - Guthrey, Harvey
AU  - Johnston, Steven
AU  - Soto, Jake
AU  - Odekirk, Bruce
AU  - Gorman, Brian P.
AU  - Al-Jassim, Mowafak
PY  - 2022
DO  - 10.1063/5.0088313
UR  - https://www.osti.gov/biblio/1871806
ID  - 1871806
ER  -