TY  - RPRT
TI  - Artificial intelligence inferred microstructural properties from voltage–capacity curves
AU  - Sun, Yixuan
AU  - Ayalasomayajula, Surya Mitra
AU  - Deva, Abhas
AU  - Lin, Guang
AU  - García, R. Edwin
PY  - 2022
DO  - 10.1038/s41598-022-16942-5
UR  - https://www.osti.gov/biblio/1879796
ID  - 1879796
ER  -