TY  - RPRT
TI  - ML for Semiconductor Bond Pad Defect Detection.
AU  - Galasso, Jennifer
AU  - Valdez, Skyler
AU  - Boone, William
AU  - Larson, Kurt
PY  - 2021
DO  - 10.2172/1882316
UR  - https://www.osti.gov/biblio/1882316
ID  - 1882316
ER  -