@misc{indiciaeaebc936f0ad3,
  title = {Improved Throughput, Statistics, and Instrument Utilization with Automated Analytical Electron Microscopy},
  author = {Cullen, David A. and Yu, Haoran and Zachman, Michael and Reeves, Shawn Kimberly and Park, Jaehyung and Kariuki, Nancy and Myers, Deborah and Hu, Leiming and Neyerlin, Kenneth C. and Mukundan, Rangachary},
  year = {2022},
  doi = {10.1017/s1431927622010947},
  url = {https://www.osti.gov/biblio/1883915},
  note = {Source identifier: 1883915}
}