@misc{indiciae79c34f3fae38,
  title = {Device Voltage Stress from Ground Leakage Current in Medium-Voltage Solid-State Transformer},
  author = {Zheng, Liran and Kandula, Rajendra Prasad and Divan, Deepak},
  year = {2022},
  doi = {10.1109/tpel.2022.3203968},
  url = {https://www.osti.gov/biblio/1887733},
  note = {Source identifier: 1887733}
}