TY  - RPRT
TI  - Device Voltage Stress from Ground Leakage Current in Medium-Voltage Solid-State Transformer
AU  - Zheng, Liran
AU  - Kandula, Rajendra Prasad
AU  - Divan, Deepak
PY  - 2022
DO  - 10.1109/tpel.2022.3203968
UR  - https://www.osti.gov/biblio/1887733
ID  - 1887733
ER  -