@misc{indiciae8ec0f798bda8,
  title = {Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy},
  author = {Roccapriore, Kevin M. and Boebinger, Matthew G. and Dyck, Ondrej and Ghosh, Ayana and Unocic, Raymond R. and Kalinin, Sergei V. and Ziatdinov, Maxim},
  year = {2022},
  doi = {10.1021/acsnano.2c07451},
  url = {https://www.osti.gov/biblio/1892401},
  note = {Source identifier: 1892401}
}