TY  - RPRT
TI  - Modeling the two-way coupling of stress, diffusion, and oxidation in heterogeneous CMC microstructures
AU  - Schichtel, Jacob J.
AU  - Chattopadhyay, Aditi
PY  - 2023
DO  - 10.1016/j.jeurceramsoc.2022.09.046
UR  - https://www.osti.gov/biblio/1893556
ID  - 1893556
ER  -