@misc{indiciae9f00e3aea334,
  title = {Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography},
  author = {Shu, Yening (ORCID:0000000326150827) and Mukherjee, Saptarshi and Chang, Tammy and Gilmore, Abigail and Tringe, Joseph W. and Stobbe, David M. and Loh, Kenneth J. (ORCID:0000000314486251)},
  year = {2022},
  doi = {10.3390/s22239167},
  url = {https://www.osti.gov/biblio/1900084},
  note = {Source identifier: 1900084}
}