TY  - RPRT
TI  - Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography
AU  - Shu, Yening (ORCID:0000000326150827)
AU  - Mukherjee, Saptarshi
AU  - Chang, Tammy
AU  - Gilmore, Abigail
AU  - Tringe, Joseph W.
AU  - Stobbe, David M.
AU  - Loh, Kenneth J. (ORCID:0000000314486251)
PY  - 2022
DO  - 10.3390/s22239167
UR  - https://www.osti.gov/biblio/1900084
ID  - 1900084
ER  -