@misc{indiciaeea0d53bbe0ac,
  title = {Quantification of defects engineered in single layer MoS 2},
  author = {Aryeetey, Frederick and Ignatova, Tetyana and Aravamudhan, Shyam},
  year = {2020},
  doi = {10.1039/d0ra03372c},
  url = {https://www.osti.gov/biblio/1903908},
  note = {Source identifier: 1903908}
}