TY  - RPRT
TI  - Quantification of defects engineered in single layer MoS 2
AU  - Aryeetey, Frederick
AU  - Ignatova, Tetyana
AU  - Aravamudhan, Shyam
PY  - 2020
DO  - 10.1039/d0ra03372c
UR  - https://www.osti.gov/biblio/1903908
ID  - 1903908
ER  -