TY  - RPRT
TI  - Microparticle Impact Testing at High Precision, Higher Temperatures, and with Lithographically Patterned Projectiles
AU  - Reiser, Alain
AU  - Schuh, Christopher A.
PY  - 2022
DO  - 10.1002/smtd.202201028
UR  - https://www.osti.gov/biblio/1905170
ID  - 1905170
ER  -