TY  - RPRT
TI  - Measuring the Migdal effect in semiconductors for dark matter detection
AU  - Adams, Duncan
AU  - Baxter, Daniel
AU  - Day, Hannah
AU  - Essig, Rouven
AU  - Kahn, Yonatan
PY  - 2023
DO  - 10.1103/physrevd.107.l041303
UR  - https://www.osti.gov/biblio/1958057
ID  - 1958057
ER  -