TY  - RPRT
TI  - ET-AL: Entropy-targeted active learning for bias mitigation in materials data
AU  - Zhang, Hengrui
AU  - Chen, Wei (Wayne)
AU  - Rondinelli, James M.
AU  - Chen, Wei
PY  - 2023
DO  - 10.1063/5.0138913
UR  - https://www.osti.gov/biblio/1961601
ID  - 1961601
ER  -