TY  - RPRT
TI  - Improved Double Pulse Test for Accurate Dynamic Characterization of Medium Voltage SiC Devices
AU  - Li, Haiguo
AU  - Gao, Zihan
AU  - Chen, Ruirui
AU  - Wang, Fei
PY  - 2022
DO  - 10.1109/tpel.2022.3210749
UR  - https://www.osti.gov/biblio/1974605
ID  - 1974605
ER  -