TY  - RPRT
TI  - Crack Growth Rate at Oxygen Electrode/Electrolyte Interface in Solid Oxide Electrolysis Cells Predicted by Experiment Coupled Multiphysics Modeling
AU  - Jayapragasam, Puvikkarasan (ORCID:0000000323775557)
AU  - Wen, Yeting
AU  - Cook, Korey
AU  - Wrubel, Jacob A. (ORCID:0000000233470768)
AU  - Ma, Zhiwen
AU  - Huang, Kevin (ORCID:0000000212324593)
AU  - Jin, Xinfang (ORCID:0000000231484904)
PY  - 2023
DO  - 10.1149/1945-7111/acd4f1
UR  - https://www.osti.gov/biblio/1974830
ID  - 1974830
ER  -