TY  - RPRT
TI  - Entropy variations and light ray operators from replica defects
AU  - Balakrishnan, Srivatsan
AU  - Chandrasekaran, Venkatesa
AU  - Faulkner, Thomas
AU  - Levine, Adam
AU  - Shahbazi-Moghaddam, Arvin
PY  - 2022
DO  - 10.1007/jhep09(2022)217
UR  - https://www.osti.gov/biblio/1976547
ID  - 1976547
ER  -