TY  - RPRT
TI  - Circuit complexity near critical points
AU  - Sood, Uday
AU  - Kruczenski, Martin
PY  - 2022
DO  - 10.1088/1751-8121/ac5b8f
UR  - https://www.osti.gov/biblio/1979449
ID  - 1979449
ER  -