@misc{indiciaefcb7635bd34f,
  title = {Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices},
  author = {Bastola, Ebin and Phillips, Adam B. (ORCID:0000000226755052) and Barros-King, Griffin and Jamarkattel, Manoj K. (ORCID:0000000327675705) and Li, Deng-Bing (ORCID:0000000290009724) and Quader, Abdul and Pokhrel, Dipendra and Friedl, Jared and Gibbs, Jacob M. and Mathew, Xavier and Yan, Yanfa and Ellingson, Randy J. (ORCID:0000000195206586) and Heben, Michael J. (ORCID:0000000237883471)},
  year = {2022},
  doi = {10.1109/jphotov.2021.3110338},
  url = {https://www.osti.gov/biblio/1980411},
  note = {Source identifier: 1980411}
}