TY  - RPRT
TI  - Understanding the Interplay Between CdSe Thickness and Cu Doping Temperature in CdSe/CdTe Devices
AU  - Bastola, Ebin
AU  - Phillips, Adam B. (ORCID:0000000226755052)
AU  - Barros-King, Griffin
AU  - Jamarkattel, Manoj K. (ORCID:0000000327675705)
AU  - Li, Deng-Bing (ORCID:0000000290009724)
AU  - Quader, Abdul
AU  - Pokhrel, Dipendra
AU  - Friedl, Jared
AU  - Gibbs, Jacob M.
AU  - Mathew, Xavier
AU  - Yan, Yanfa
AU  - Ellingson, Randy J. (ORCID:0000000195206586)
AU  - Heben, Michael J. (ORCID:0000000237883471)
PY  - 2022
DO  - 10.1109/jphotov.2021.3110338
UR  - https://www.osti.gov/biblio/1980411
ID  - 1980411
ER  -