@misc{indiciae8e2f204df835,
  title = {Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node},
  author = {Xiong, Yoni and Feeley, Alexandra T. (ORCID:0000000162881315) and Ball, Dennis R. and Bhuva, Bharat L. (ORCID:000000022171100X)},
  year = {2022},
  doi = {10.1109/tns.2021.3138501},
  url = {https://www.osti.gov/biblio/1980531},
  note = {Source identifier: 1980531}
}