TY  - RPRT
TI  - Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node
AU  - Xiong, Yoni
AU  - Feeley, Alexandra T. (ORCID:0000000162881315)
AU  - Ball, Dennis R.
AU  - Bhuva, Bharat L. (ORCID:000000022171100X)
PY  - 2022
DO  - 10.1109/tns.2021.3138501
UR  - https://www.osti.gov/biblio/1980531
ID  - 1980531
ER  -