@misc{indiciae008af454f345,
  title = {Multiphysics modeling of SOFC performance degradation caused by interface delamination and active layer cracking},
  author = {Yang, Tao and Fan, Yueying and Liu, Jian and Finklea, Harry and Lee, Shiwoo and Guan, Bo and Abernathy, Harry W. and Kalapos, Thomas L. and Hackett, Gregory A.},
  year = {2022},
  doi = {10.1016/j.ijhydene.2022.09.194},
  url = {https://www.osti.gov/biblio/1984084},
  note = {Source identifier: 1984084}
}