TY  - RPRT
TI  - Multiphysics modeling of SOFC performance degradation caused by interface delamination and active layer cracking
AU  - Yang, Tao
AU  - Fan, Yueying
AU  - Liu, Jian
AU  - Finklea, Harry
AU  - Lee, Shiwoo
AU  - Guan, Bo
AU  - Abernathy, Harry W.
AU  - Kalapos, Thomas L.
AU  - Hackett, Gregory A.
PY  - 2022
DO  - 10.1016/j.ijhydene.2022.09.194
UR  - https://www.osti.gov/biblio/1984084
ID  - 1984084
ER  -