TY  - RPRT
TI  - Smart manufacturing maturity models and their applicability: a review
AU  - Vance, David
AU  - Jin, Mingzhou
AU  - Price, Christopher
AU  - Nimbalkar, Sachin U.
AU  - Wenning, Thomas
PY  - 2023
DO  - 10.1108/jmtm-03-2022-0103
UR  - https://www.osti.gov/biblio/1987786
ID  - 1987786
ER  -