@misc{indiciae36e93ccdb1df,
  title = {Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis},
  author = {Huan, Junjun and Dehghanzadeh, Peyman and Mandal, Soumyajit and Bhunia, Swarup},
  year = {2023},
  doi = {10.1109/access.2023.3300222},
  url = {https://www.osti.gov/biblio/1997930},
  note = {Source identifier: 1997930}
}