TY  - RPRT
TI  - Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis
AU  - Huan, Junjun
AU  - Dehghanzadeh, Peyman
AU  - Mandal, Soumyajit
AU  - Bhunia, Swarup
PY  - 2023
DO  - 10.1109/access.2023.3300222
UR  - https://www.osti.gov/biblio/1997930
ID  - 1997930
ER  -